| Current Path : /sys/amd64/compile/hs32/modules/usr/src/sys/modules/usb/uplcom/@/dev/rndtest/ |
FreeBSD hs32.drive.ne.jp 9.1-RELEASE FreeBSD 9.1-RELEASE #1: Wed Jan 14 12:18:08 JST 2015 root@hs32.drive.ne.jp:/sys/amd64/compile/hs32 amd64 |
| Current File : //sys/amd64/compile/hs32/modules/usr/src/sys/modules/usb/uplcom/@/dev/rndtest/rndtest.h |
/* $FreeBSD: release/9.1.0/sys/dev/rndtest/rndtest.h 139749 2005-01-06 01:43:34Z imp $ */
/* $OpenBSD$ */
/*-
* Copyright (c) 2002 Jason L. Wright (jason@thought.net)
* All rights reserved.
*
* Redistribution and use in source and binary forms, with or without
* modification, are permitted provided that the following conditions
* are met:
* 1. Redistributions of source code must retain the above copyright
* notice, this list of conditions and the following disclaimer.
* 2. Redistributions in binary form must reproduce the above copyright
* notice, this list of conditions and the following disclaimer in the
* documentation and/or other materials provided with the distribution.
* 3. All advertising materials mentioning features or use of this software
* must display the following acknowledgement:
* This product includes software developed by Jason L. Wright
* 4. The name of the author may not be used to endorse or promote products
* derived from this software without specific prior written permission.
*
* THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR
* IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED
* WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
* DISCLAIMED. IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT,
* INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES
* (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
* SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION)
* HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
* STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN
* ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
* POSSIBILITY OF SUCH DAMAGE.
*/
/* Some of the tests depend on these values */
#define RNDTEST_NBYTES 2500
#define RNDTEST_NBITS (8 * RNDTEST_NBYTES)
struct rndtest_state {
device_t rs_parent; /* associated device */
u_int8_t *rs_end, *rs_begin, *rs_current;
struct callout rs_to;
int rs_collect; /* collect and test data */
int rs_discard; /* discard/accept random data */
u_int8_t rs_buf[RNDTEST_NBYTES];
};
struct rndtest_stats {
u_int32_t rst_discard; /* number of bytes discarded */
u_int32_t rst_tests; /* number of test runs */
u_int32_t rst_monobit; /* monobit test failures */
u_int32_t rst_runs; /* 0/1 runs failures */
u_int32_t rst_longruns; /* longruns failures */
u_int32_t rst_chi; /* chi^2 failures */
};
extern struct rndtest_state *rndtest_attach(device_t dev);
extern void rndtest_detach(struct rndtest_state *);
extern void rndtest_harvest(struct rndtest_state *arg, void * buf, u_int len);